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Until now, we have assumed that all instrumental effects could be factored into feed-based contributions, i.e. we have ignored any interferometer-based effects. This is justified for a well-designed system, provided that the signal-to-noise ratio is large enough (thermal noise causes interferometer-based errors, albeit with a an average of zero). However, if systematic errors do occur, they can be modelled:
The 4 x 4 diagonal matrix
, the `Correlator matrix',
represents interferometer-based corrections that are applied to the
uv-data in software by the on-line system. Examples are the Van Vleck
correction. In the newest correlators, it approaches a constant
(
).
The 4 x 4 diagonal matrix
represents multiplicative interferometer-based effects.
The 4-element vector
represents additive
interferometer-based effects. Examples are receiver noise, and
correlator offsets.
In some cases, interferometer-based effects can be calibrated, e.g. when they appear to be constant in time. It will be interesting to see how many of them will disappear as a result of better modelling with the Measurement Equation. In any case, it is desirable that the cause of interferometer-based effects is properly understood (simulation!).